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Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron lightKILMAMETOV, A. R; VAUGHAN, G; YAVARI, A. R et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2009, Vol 503, Num 1-2, pp 10-13, issn 0921-5093, 4 p.Conference Paper